Rise of industry torrent 7.2 drivers#

(The Hong Kong University of Science and Technology, China) 13:25-13:50Дў-4Impact of OFF-State Gate Bias on Dynamic RON of p-GaN Gate HEMT. Li Zhang, Song Yang, Zheyang Zheng, Wenjie Song, Hang Liao, Kevin Jing Chen (ECE Department, HKUST, Hong Kong) 13:00-13:25Дў-3Surface Reinforcement Technology for Suppressing Hot-Carrier-Induced Degradations in p-GaN Gate Power HEMTs Kailun Zhong, Han Xu, Song Yang, Zheyang Zheng, Junting Chen, Kevin Jing Chen (The Hong Kong University of Science and Technology, China) 12:35-13:00Дў-2A Bootstrap Voltage Clamping Circuit for Dynamic VTH Characterization in Schottky-Type p-GaN Gate Power HEMT Yan Cheng, Yuru Wang, Sirui Feng, Zheyang Zheng, Tao Chen, Gang Lyu, Yat Hon Ng, Kevin Jing Chen ( 1Melco Semiconductor Engineering Corporation, Japan 2Mitsubishi Electric Corporation, Japan) Session 2: Dynamic Ron & Reliability of p-GaN Gate TechnologiesДЎ2:10-13:50 Chair Grace Xing(Cornell University) Yoshinao Miura(AIST) 12:10-12:35Дў-1Impact Ionization Induced Breakdown and Related HTRB Behaviors in 100-V p-GaN Gate HEMTs Kenji Suzuki 2, Takuya Yoshida 1, Yuki Haraguchi 2, Hidenori Koketsu 2, Atsushi Narazaki 2 ( 1mqSemi AG, Switzerland 2Silvaco Europe Ltd., United Kingdom) 13:00-13:25ДЎ-3Low Switching Loss Diode of 600V RC-IGBT with New Contact Structure Munaf Rahimo 1, Iulian Nistor 1, David Green 2 (Mitsubishi Electric Corporation, Japan) 12:35-13:00ДЎ-2Singular Point Source MOS Cell Concept (S-MOS) Implemented on a Narrow Mesa Trench IGBT

Koichi Nishi, Chen Ze, Koji Tanaka, Keisuke Eguchi, Takamasa Miyazaki, Akihiko Furukawa

PL2-2How System Basis Chips rise to the power and reliability challenges for future-proof electrification and autonomous vehicle electronic control unit designsД®rwan Hemon (NXP) Oral sessions Tuesday JSession 1: IGBTsДЎ2:10-13:25 Chair Shigeto Honda(Mitsubishi Electric Corporation) Yi Tang(Starpower Semiconductor) 12:10-12:35ДЎ-1Self-Turn-on-Free 1200V Scaled CSTBTв„ў Driven by 5V Gate Voltage with Wide SOA PL2-1Building Blocks of Past, Present and Future BCD TechnologiesДЇranГ§ois HГ©bert (Global Foundries) 15:00-15:40

Rise of industry torrent 7.2 drivers#

PL1-2GaN 2.0: Power FinFETs, Complementary Gate Drivers and Low-Cost Vertical DevicesДЎ4:20-15:40 Chair Ichiro Omura(Kyushu Institute of Technology) Kevin Chen(Hong Kong University of Science and Technology) 14:20-15:00 Yasushi Shinojima (MIRISE Technologies Corporation,Japan) 13:20-14:00 PL1-1Automotive semiconductors in the CASE era ISPSD2021 Program at a glance Opening session Monday May 31, 2021ДЎ2:10-12:40 Chair Kimimori Hamada(PDPlus LLC) Ichiro Omura(Kyushu Institute of Technology) Plenary sessions Monday Plenary 1ДЎ2:40-14:00 Chair Kimimori Hamada(PDPlus LLC) Wai Tung Ng(University of Toronto) 12:40-13:20